Methods of correction of typical defects in the
digital images on the examle of SEM images of anodic oxide layers
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Methods of correction of typical defects in the
digital images on the examle of SEM images of anodic oxide layers
Data publikacji: 13.12.2016
Czasopismo Techniczne, 2016, Mechanika Zeszyt 3-M (10) 2016, s. 23 - 29
https://doi.org/10.4467/2353737XCT.16.116.5727Autorzy
Methods of correction of typical defects in the
digital images on the examle of SEM images of anodic oxide layers
The paper proposes one of the possible methods of image quality improvements. There are materials whose preparation for microstructure observation is difficult and, despite the effort, poor quality images are obtained. Computer image processing techniques allow for image transformation by means of various tools and obtaining much better images, with much more visible details than in the raw image. When it is impossible to prepare the sample better for microscopy observation and microstructural analysis, proper image processing is the only solution to gather information about the tested material.
Informacje: Czasopismo Techniczne, 2016, Mechanika Zeszyt 3-M (10) 2016, s. 23 - 29
Typ artykułu: Oryginalny artykuł naukowy
Tytuły:
Methods of correction of typical defects in the
digital images on the examle of SEM images of anodic oxide layers
Methods of correction of typical defects in the
digital images on the examle of SEM images of anodic oxide layers
Institute of Applied Informatics, Faculty of Mechanical Engineering, Cracow University of Technology
Department of Surface Layer Technology, Faculty of Computer and Materials Science, University of Silesia
Publikacja: 13.12.2016
Status artykułu: Otwarte
Licencja: Żadna
Udział procentowy autorów:
Korekty artykułu:
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AngielskiLiczba wyświetleń: 1313
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