Methods of correction of typical defects in the
digital images on the examle of SEM images of anodic oxide layers
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Methods of correction of typical defects in the
digital images on the examle of SEM images of anodic oxide layers
Publication date: 13.12.2016
Technical Transactions, 2016, Mechanics Issue 3-M (10) 2016, pp. 23 - 29
https://doi.org/10.4467/2353737XCT.16.116.5727Authors
Methods of correction of typical defects in the
digital images on the examle of SEM images of anodic oxide layers
The paper proposes one of the possible methods of image quality improvements. There are materials whose preparation for microstructure observation is difficult and, despite the effort, poor quality images are obtained. Computer image processing techniques allow for image transformation by means of various tools and obtaining much better images, with much more visible details than in the raw image. When it is impossible to prepare the sample better for microscopy observation and microstructural analysis, proper image processing is the only solution to gather information about the tested material.
Information: Technical Transactions, 2016, Mechanics Issue 3-M (10) 2016, pp. 23 - 29
Article type: Original article
Titles:
Methods of correction of typical defects in the
digital images on the examle of SEM images of anodic oxide layers
Methods of correction of typical defects in the
digital images on the examle of SEM images of anodic oxide layers
Institute of Applied Informatics, Faculty of Mechanical Engineering, Cracow University of Technology
Department of Surface Layer Technology, Faculty of Computer and Materials Science, University of Silesia
Published at: 13.12.2016
Article status: Open
Licence: None
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Number of downloads: 933